Combined in-situ and ex-situ optical analysis of fluoride coatings deposited by PIAD

S. Wilbrandt; O. Stenzel; N. Kaiser

doi:10.1364/OIC.2010.TuD2

Optical Interference Coatings
OSA Technical Digest (Optica Publishing Group, 2010),
paper TuD2
•https://doi.org/10.1364/OIC.2010.TuD2

Combined in-situ and ex-situ optical analysis of fluoride coatings deposited by PIAD

S. Wilbrandt, O. Stenzel, and N. Kaiser

Optical Interference Coatings 2010

Tucson, Arizona United States
6–11 June 2010
ISBN: 978-1-55752-891-9

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Deposition Control and Applications (TuD)

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S. Wilbrandt, O. Stenzel, and N. Kaiser, "Combined in-situ and ex-situ optical analysis of fluoride coatings deposited by PIAD," in Optical Interference Coatings, OSA Technical Digest (Optica Publishing Group, 2010), paper TuD2.

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Abstract

The combination of ex-situ and in-situ spectrophotometry allows getting insight into the depth distribution of optical losses in PIAD coatings. This optical characterization strategy is exemplified in application to fluoride coatings.

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