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Conferences > OIC > 2010 > MC > MC4

Determining Quality of Microcrystal Silicon Thin films Based on Infrared Absorption Coefficients

Sheng-Hui Chen, Hung-Ju Lin, Ting-Wei Chang, Hsuan-Wen Wang, Cheng-Chung Lee, Chun-Ming Yeh, and Yen-Yu Pan

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Abstract

We proposed the absorption coefficient ratio of (1.4 eV)/ (0.8 eV) as the quality factor of microcrystalline silicon thin films. It is convinced that a proportional relationship is between quality factor and solar cell efficiency.

© 2010 Optical Society of America

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