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Optical constants determination of an anisotropic thin film by measuring the polarization states associated with polarization conversion reflection

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Abstract

In this work, the polarization state of reflected light from anisotropic thin film is studied and measured when the polarization conversion reflection become obvious. It is found that the polarization state measurement is a sensitive method to detect the optical constants of the anisotropic thin film.

© 2007 Optical Society of America

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