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Conferences > OIC > 2004 > WB > WB5

Dedicated Spectrophotometer for localized transmittance and reflectance measurements

L. Abel-Tiberini, F. Lemarquis, and M. Lequime

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Abstract

A dedicated set up is build to obtain localized transmittance and reflectance spectral measurements. The spatial resolution ranges from 50 µm up to 2 mm and the spectral resolution is about 5 nm. This apparatus can be used to study the index and thickness uniformity on single layers in order to determine and optimize the characteristics of the deposition chamber. It can also be used to measure the optical characteristics of intended non uniform coatings such as linearly variable filters.

© 2004 Optical Society of America

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