Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Observations on the effect of retrace error in scanning white light interferometry of smooth optical surfaces

Not Accessible

Your library or personal account may give you access

Abstract

Retrace errors in interferometric measurements is a known phenomenon. The impact of retrace error in stitching CSI measurements is studied, estimates of retrace error in a CSI instrument and methods in correcting it is outlined.

© 2019 The Author(s)

PDF Article
More Like This
Quadratic extension to retrace error calibration algorithm for non-null interferometric surface figure testing of nominally flat reflective surfaces

Martin Tangari Larrategui, Yanqi Zhang, Andrew D. Rocha, Thomas G. Brown, and Jonathan D. Ellis
JW3A.7 Freeform Optics (Freeform) 2019

Advances in micro-lens surface metrology: the role of retrace errors

Neil Gardner and Angela Davies
OTuD3 Optical Fabrication and Testing (OF&T) 2004

Measuring High-Slope and Super-Smooth Optics with High-Dynamic-Range Coherence Scanning Interferometry

Martin F. Fay, Xavier Colonna de Lega, and Peter de Groot
OW1B.3 Optical Fabrication and Testing (OF&T) 2014

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved