Increased Precision of Zernike Fit to Noisy Truncated Phase Maps

Kathleen Adelsberger; Stephen Mack; Ted Tienvieri; Tim Rich

doi:10.1364/FREEFORM.2017.JTu5A.20

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Optical Fabrication and Testing 2017

Denver, Colorado United States
9–13 July 2017
ISBN: 978-1-943580-31-6

From the session
Poster Session (JTu5A)

Increased Precision of Zernike Fit to Noisy Truncated Phase Maps

Kathleen Adelsberger, Stephen Mack, Ted Tienvieri, and Tim Rich

Author Affiliations

Kathleen Adelsberger, Stephen Mack, Ted Tienvieri, Tim Rich Corning Tropel, United States

K Adelsberger
S Mack
T Tienvieri
T Rich

Optical Design and Fabrication 2017 (Freeform, IODC, OFT)
OSA Technical Digest (online) (Optical Society of America, 2017),
paper JTu5A.20
•https://doi.org/10.1364/FREEFORM.2017.JTu5A.20

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K. Adelsberger, S. Mack, T. Tienvieri, and T. Rich, "Increased Precision of Zernike Fit to Noisy Truncated Phase Maps," in Optical Design and Fabrication 2017 (Freeform, IODC, OFT), OSA Technical Digest (online) (Optical Society of America, 2017), paper JTu5A.20.

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Related Topics
Previously assigned OCIS codes
- Aberrations (global) (220.1010)
- Alignment (220.1140)
- Testing (220.4840)

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Abstract

Abstract

When a polynomial set fails to meet the conditions of orthogonality, errors appear in the calculated coefficients. Restoring orthogonality by fitting a custom Zernike set to noisy phase maps provides increased precision in low-order coefficients.

PDF Article

Optical Fabrication and Testing 2017
Denver, Colorado United States
9–13 July 2017
ISBN: 978-1-943580-31-6
From the session Poster Session (JTu5A)

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Abstract

Optical Fabrication and Testing 2017

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