Two-channel phase modulated ellipsometry: an ultra-fast diagnostic technique for uniaxial media

Chun-I Chuang; Yu-Faye Chao

doi:10.1364/OFT.2008.OThC3

Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing
OSA Technical Digest (CD) (Optica Publishing Group, 2008),
paper OThC3
•https://doi.org/10.1364/OFT.2008.OThC3

Two-channel phase modulated ellipsometry: an ultra-fast diagnostic technique for uniaxial media

Chun-I Chuang and Yu-Faye Chao

Optical Fabrication and Testing 2008

Rochester, New York United States
21–24 October 2008
ISBN: 978-1-55752-861-2

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C. Chuang and Y. Chao, "Two-channel phase modulated ellipsometry: an ultra-fast diagnostic technique for uniaxial media," in Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing, OSA Technical Digest (CD) (Optica Publishing Group, 2008), paper OThC3.

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Abstract

A two-channel phase modulated ellipsometry has been used to measure the optical properties of an uniaxial material, which include the complex refractive indices and the azimuth angle of its principle axes.

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