Surface profilometry using liquid crystal grating projection

Toru Yoshizawa; Masayuki Yamamoto; Hiroo Fujita

doi:10.1364/OFT.2006.OFWA3

Frontiers in Optics
OSA Technical Digest (CD) (Optica Publishing Group, 2006),
paper OFWA3
•https://doi.org/10.1364/OFT.2006.OFWA3

Surface profilometry using liquid crystal grating projection

Toru Yoshizawa, Masayuki Yamamoto, and Hiroo Fujita

Optical Fabrication and Testing 2006

Rochester, New York United States
9–11 October 2006
ISBN: 1-55752-818-7

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Uncommon Ideas and Often Missed Details: In Memory of Frank Cooke (OFWA)

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T. Yoshizawa, M. Yamamoto, and H. Fujita, "Surface profilometry using liquid crystal grating projection," in Frontiers in Optics, OSA Technical Digest (CD) (Optica Publishing Group, 2006), paper OFWA3.

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Abstract

A specified liquid crystal (LC) device is shown for three dimensional profile measurement systems based on triangulation principle using phase shifting technique. Dual projection is available to improve problems in conventional pattern projection method.

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