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Conferences > OFT > 2004 > OMB > OMB2
  • Frontiers in Optics 2004/Laser Science XXII/Diffractive Optics and Micro-Optics/Optical Fabrication and Testing
  • OSA Technical Digest (CD) (Optica Publishing Group, 2004),
  • paper OMB2
  • •https://doi.org/10.1364/OFT.2004.OMB2

Modeling the effects of silicone contaminants on the US Lab window assembly using optical thin-film analysis

C. K. Carniglia, James Visentine, Paul Boeder, John Alred, and Christopher Shaw

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Abstract

Multi-layer thin-film analysis can model the effects of the deposition of DC-704 pump oil in the presence of VUV radiation onto a sample with an antireflection coating. The model suggests that the resulting film is SiO2.

© 2004 Optical Society of America

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