High-accuracy reflectance mapping of microoptical components

S. Nerreter; R. Grunwald; A. Bärwolff; J. W. Tomm

doi:10.1364/OFT.2000.PD2

Optical Fabrication and Testing
OSA Technical Digest (Optica Publishing Group, 2000),
paper PD2
•https://doi.org/10.1364/OFT.2000.PD2

High-accuracy reflectance mapping of microoptical components

S. Nerreter, R. Grunwald, A. Bärwolff, and J. W. Tomm

Optical Fabrication and Testing 2000

Québec City Canada
ISBN: 1-55752-637-0

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S. Nerreter, R. Grunwald, A. Bärwolff, and J. W. Tomm, "High-accuracy reflectance mapping of microoptical components," in Optical Fabrication and Testing, OSA Technical Digest (Optica Publishing Group, 2000), paper PD2.

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Abstract

An automated system for the spatially-resolved reflectance measurement of microoptical components with low or graded reflectivity was developed. By a two-channel lock-in processing, an accuracy of 0.1% could be realized.

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