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High dynamic strain measurements and aliasing suppression capability using a PDA-based spectrometer design

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Abstract

In this paper a 3.3 kHz dynamic strain measurement system using a photodiode array-based spectrometer is presented. The paper focuses on the possible occurrence of aliasing components and the capability of suppressing these components using an intrinsic parameter of the measurement system namely the integration time. A theoretical model is discussed together with experimental results to validate this model. It is shown that the suppression of the aliasing components can be significant.

© 2006 IEICE

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