Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > OFS > 1997 > OThC > OThC23

Simultaneous Measurement of Phase and Group Indices of Transparent Plates Using the Low Coherence Interferometry

M. Haruna, H. Tajiri, T. Mitsuyama, M. Ohmi, and H. Maruyama

Not Accessible

Your library or personal account may give you access

Abstract

The low coherence interferometry is useful for optical ranging, e. g. measurement of the thickness of a transparent plate, with an accuracy of micrometer.

© 1997 Optical Society of America

PDF Article
More Like This
Simultaneous Measurement of Refractive Index and Thickness of Transparent Plates by Low Coherence Interferometry — Proposal and Demonstration —

M. Ohmi, T. Shiraishi, H. Tajiri, and M. Haruna
We340 Optical Fiber Sensors (OFS) 1996

Group Refractive Index Dispersion Measurement using Low-Coherence Tandem Interferometer

A. Hirai, K. Sasaki, and H. Matsumoto
CMII4 Conference on Lasers and Electro-Optics (CLEO:S&I) 2006

Optical plate thickness measurement with single-shot low coherence interferometry

Claudio Pernechele, Demetrio Magrin, and Gabriele Rodeghiero
OM2B.4 Optical Fabrication and Testing (OF&T) 2017

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use