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Conferences > OFC > 2017 > Tu3D > Tu3D.7

Gaussian Process Regression for WDM System Performance Prediction

Jesper Wass, Jakob Thrane, Molly Piels, Rasmus Jones, and Darko Zibar

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Abstract

Gaussian process regression is numerically and experimentally investigated to predict the bit error rate of a 24 ×28 GBd QPSK WDM system. The proposed method produces accurate predictions from multi-dimensional and sparse measurement data.

© 2017 Optical Society of America

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