Design, Reliability and Qualification of Photonic Crossconnects based on Digital MEMS

P. De Dobbelaere; S. Gloeckner; S. Patra; L. Fan; D. Reiley; C. King; T. Yeh; J. Gritters; Y. Loke; E. Kruglick; R. Chen; M. Harburn; S. Gutierrez; M. Harisson; P. Marchand; A. Sharma; D. Vacar; J. Hirshkoff; A. Oviedo; J. Ford; A. Belenky; V. Fedoriouk; D. Ferrel; O. Gumuz; P. Keegan; J. Le; S. O’Connor; D. Rines; C. Tran; C. Vacar; J. Ward; A. Husain; H.-J. Schmidtke; B.H. Heppner

Optical Fiber Communications Conference
OSA Trends in Optics and Photonics (Optica Publishing Group, 2002),
paper ThGG70

Design, Reliability and Qualification of Photonic Crossconnects based on Digital MEMS

P. De Dobbelaere, S. Gloeckner, S. Patra, L. Fan, D. Reiley, C. King, T. Yeh, J. Gritters, Y. Loke, E. Kruglick, R. Chen, M. Harburn, S. Gutierrez, M. Harisson, P. Marchand, A. Sharma, D. Vacar, J. Hirshkoff, A. Oviedo, J. Ford, A. Belenky, V. Fedoriouk, D. Ferrel, O. Gumuz, P. Keegan, J. Le, S. O’Connor, D. Rines, C. Tran, C. Vacar, et al.

Optical Fiber Communication Conference 2002

Anaheim, California United States
ISBN: 1-55752-700-8

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P. De Dobbelaere, S. Gloeckner, S. Patra, L. Fan, D. Reiley, C. King, T. Yeh, J. Gritters, Y. Loke, E. Kruglick, R. Chen, M. Harburn, S. Gutierrez, M. Harisson, P. Marchand, A. Sharma, D. Vacar, J. Hirshkoff, A. Oviedo, J. Ford, A. Belenky, V. Fedoriouk, D. Ferrel, O. Gumuz, P. Keegan, J. Le, S. O’Connor, D. Rines, C. Tran, C. Vacar, J. Ward, A. Husain, H. -. Schmidtke, and B. H. Heppner, "Design, Reliability and Qualification of Photonic Crossconnects based on Digital MEMS," in Optical Fiber Communications Conference, A. Sawchuk, ed., Vol. 70 of OSA Trends in Optics and Photonics (Optica Publishing Group, 2002), paper ThGG70.

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Abstract

While a number of photonic switching technologies have been demonstrated, micro-electromechanical systems (MEMS) has been widely recognized as providing key advantages in scalability of switch fabric size, wavelength range, optical loss and power dissipation. In this paper we focus primarily on the technical challenges, optical performance and reliability of N × N switches (N = 8 and 16).

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