Abstract

Novel components for future ultrahigh-speed networks, operating at single stream rates of 100 Gbit/s, are currently being developed. To date, system tests of these components at rates exceeding 12 GHz have been performed using electronic biterror-rate test sets (BERTs) and optical bit interleaving. Novel components could also be tested using the all-optical pattern generator and matching circuit we describe here. In this system, the optical pattern generator is a fiber loop memory and the matching circuit is dual input, nonlinear optical loop mirror (NOLM) exclusive OR (XOR) gate.¹ This initial system demonstration is performed at 10 Gbit/s, the optical pattern generator rate. Fiber loop memory operation at 50 Gbit/s² suggests that this all-optical bit pattern generation and matching scheme could operate at speeds well in excess of those offered by an electronic BERT.

© 1996 Optical Society of America