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Conferences > OFC > 1990 > WI > WI1

High resolution optical time domain reflectometry for integrated optics

W. HODEL, P. BEAUD, J. SCHUTZ, and H. P. WEBER

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Abstract

Optical time domain reflectometry (OTDR) is a well known method for the diagnostics of fiber optic systems. For the characterization of integrated optical structures with typical dimensions of only a few millimeters, however, the spatial resolution and dynamic range of a standard OTDR system are insufficient. The successful operation of a high resolution OTDR system crucially depends on the choice of the light source and detection technique.

© 1990 Optical Society of America

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