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White-light characterization of Integrated-optic waveguides and devices

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Abstract

Optical characterization of waveguides is commonly done using a laser source at the wavelength of interest. The information is usually deduced from near-field measurements.1,2 Recently, Thyagarajan et al.3 demonstrated a spectral transmission method for measurements of the cutoff wavelength in Ti:LiNbO3 waveguides, analogous to a technique used for optical fiber characterization. Using a similar system we were able to extend this technique and measure other important waveguide parameters. Moreover, we have applied this technique to the characterization of integrated-optic devices. We have found this method to be useful for routine control of the fabrication process as well as an important guide in the design of new structures and devices.

© 1987 Optical Society of America

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