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Conferences > OEDI > 2018 > OF4A > OF4A.3

All-electrical Microwave Characterization of High-speed Optoelectronic Devices with Self-reference and On-chip Capability

Mengke Wang, Xinhai Zou, Heng Wang, Yali Zhang, Zhiyao Zhang, Shangjian Zhang, and Yong Liu

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Abstract

We demonstrate a damage-free, self-calibrated RF characterization of integrated optoelectronic devices. Fiber-coupling-free operation can be achieved while extracting the frequency responses of wideband modulator and photodetector chips, with no requirement of electro-optical or opto-electrical calibration.

© 2018 The Author(s)

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