Abstract
This paper describes an SOA bar prober used as a high-throughput, manufacturing-oriented testing system. It is capable of automatically measuring optical gain, far-field, L-I and V-I characteristics of individual chips of multiple SOA bars.
© 2005 Optical Society of America
PDF ArticleMore Like This
T. Akiyama, M. Ekawa, M. Sugawara, K Kawaguchi, H. Sudo, H. Kuwatsuka, H. Ebe, A. Kuramata, and Y. Arakawa
OWM2 Optical Fiber Communication Conference (OFC) 2005
T. Akiyama, K. Kawaguchi, M. Ekawa, M. Sugawara, H. Kuwatsuka, H. Sudo, K. Otsubo, S. Okumura, A. Uetake, F. Futami, and S. Watanabe
MB1 Optical Amplifiers and Their Applications (OAA) 2005
H. Mawatari, F. Ichikawa, K. Kasaya, H. Ishii, H. Oohashi, and Y. Tohmori
WA3 Optical Amplifiers and Their Applications (OAA) 2005