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Conferences > OAA > 2003 > MA > MA4

Pattern-dependent bit error characteristics induced by asymmetrically filtering of CS-RZ signal

Akira Agata, Takehiro Tsuritani, Itsuro Morita, and Noboru Edagawa

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Abstract

We have experimentally and numerically studied the pattern dependency in bit error characteristics of asymmetrically filtered CS-RZ signals. We have found that the bit error intensively occurs just after the end of a long sequence of 1s or 0s for strong asymmetrical filtering.

© 2003 Optical Society of America

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