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Distributed-gain measurements and splice loss characterization in S-band TDFA by coherent optical frequency-domain reflectometry

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Abstract

We describe the implementation of the OFDR technique to characterize S-band TDFA amplifiers. Using this non-destructive method, we have characterized the distributed gain along the fiber length and the silica-to-ZBLAN fiber splice losses.

© 2002 Optical Society of America

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