Abstract

We report a nonlinear SIM method that utilizes the nonlinearity of stimulated emission depletion (STED) effect to break the diffraction limit, and surface plasmon resonance (SPR) to enhance STED field and improve resolution.

© 2013 Optical Society of America

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More Like This
Optical resolution enhancement and background reduction by stimulated emission depletion structured illumination microscopy with structured excitation

Fumihiro Dake, Shigeru Nakayama, and Yusuke Taki
NM2C.4 Novel Techniques in Microscopy (NTM) 2015

Depletion Dynamics for Stimulated Emission Depletion (STED) Microscopy

Margaret C. Chiang, Juan C. Garcia, and Jia-Ming Liu
CFT4 Conference on Lasers and Electro-Optics (CLEO) 2008

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Brendan M. Heffernan, Stephanie A. Meyer, Diego Restrepo, Mark E. Siemens, Emily A. Gibson, and Juliet T. Gopinath
SW4J.3 CLEO: Science and Innovations (CLEO_SI) 2018