Nanometric resolution using far-field optical tomographic microscopy in the multiple scattering regime

J. Girard; G. Maire; K. Belkebir; H. Giovannini; P. C. Chaumet; A. Sentenac

doi:10.1364/NTM.2011.NMB4

Optics in the Life Sciences
OSA Technical Digest (CD) (Optica Publishing Group, 2011),
paper NMB4
•https://doi.org/10.1364/NTM.2011.NMB4

Nanometric resolution using far-field optical tomographic microscopy in the multiple scattering regime

J. Girard, G. Maire, K. Belkebir, H. Giovannini, P. C. Chaumet, and A. Sentenac

Novel Techniques in Microscopy 2011

Monterey, California United States
4–6 April 2011
ISBN: 978-1-55752-909-1

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J. Girard, G. Maire, K. Belkebir, H. Giovannini, P. C. Chaumet, and A. Sentenac, "Nanometric resolution using far-field optical tomographic microscopy in the multiple scattering regime," in Optics in the Life Sciences, OSA Technical Digest (CD) (Optica Publishing Group, 2011), paper NMB4.

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Abstract

Optical Tomographic Microscopy is a technique allowing to reconstruct high-resolution 3D maps of permittivity. We found an experiment case where multiple scattering leads to image resolution beyond diffraction limit.

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