The present work reports structural and ellipsometric characterization of Ag/Bi stacks. It demonstrates a possibility for tuning of the epsilon-near-zero region and reduction of the optical losses in a wide spectral range from 0.75 to 3.5 eV.

© 2020 The Author(s)

PDF Article


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription