Abstract
The ability to image nanostructures with far-field visible light optics is lim-ited by diffraction. We use Near-field Scanning Optical Microscopy (NSOM/SNOM) to increase resolution of luminescence imaging, while avoiding radiation damage.
© 2019 The Author(s)
PDF ArticleMore Like This
Walid A. Atia, Saeed Pilevar, Badri Gopalan, Peter Heim, Mario Dagenais, and Christopher C. Davis
QTuB26 Quantum Electronics and Laser Science Conference (QELS) 1996
Walid Ali Atia, Saeed Pilevar, Ali Güngör, and Christopher C. Davis
CWF44 Conference on Lasers and Electro-Optics (CLEO) 1995
A. Ozcan, E. Cubukcu, A. Bilenca, K. Crozier, B.E. Bouma, F. Capasso, and G.J. Tearney
QTuK3 Quantum Electronics and Laser Science Conference (QELS) 2007