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Conferences > NLO > 2017 > NTu3A > NTu3A.8

Measurement of Refractive Indices of CdSiP2 at Temperatures from 85 to 450 K

Jean Wei, Joel M. Murray, Frank K. Hopkins, Douglas M. Krein, Kevin T. Zawilski, Peter G. Schunemann, and Shekhar Guha

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Abstract

Ordinary and extraordinary refractive indices of CdSiP2 were measured and Sellmeier coefficients obtained, for the first time to our knowledge over the temperature range 85 to 450 K.

© 2017 Optical Society of America

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