Subtraction threshold for fluorescence difference microscopy

N. Wang; N. Wang; T. Kobayashi; T. Kobayashi; T. Kobayashi; T. Kobayashi

doi:10.1364/NLO.2015.NW3B.5

Nonlinear Optics
OSA Technical Digest (online) (Optica Publishing Group, 2015),
paper NW3B.5
•https://doi.org/10.1364/NLO.2015.NW3B.5

Subtraction threshold for fluorescence difference microscopy

N. Wang and T. Kobayashi

Nonlinear Optics 2015

Kauai, Hawaii United States
26–31 July 2015
ISBN: 978-1-55752-001-2

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Nonlinear Microscopy II (NW3B)

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N. Wang and T. Kobayashi, "Subtraction threshold for fluorescence difference microscopy," in Nonlinear Optics, OSA Technical Digest (online) (Optica Publishing Group, 2015), paper NW3B.5.

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Abstract

The selection criterion of subtraction factors used in subtraction microscopy is numerically investigated. The fluorescence peak intensity after subtraction and resolution derivative are proposed as essential parameters for evaluating the subtraction threshold.

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