Polarization-interferometric Nonlinear Confocal Microscopy for Measuring Single Nanoparticle

Chikara Egami

doi:10.1364/NLO.2013.NW4A.37

Nonlinear Optics
OSA Technical Digest (online) (Optica Publishing Group, 2013),
paper NW4A.37
•https://doi.org/10.1364/NLO.2013.NW4A.37

Polarization-interferometric Nonlinear Confocal Microscopy for Measuring Single Nanoparticle

Chikara Egami

Nonlinear Optics 2013

Kohala Coast, Hawaii United States
21–26 July 2013
ISBN: 978-1-55752-977-0

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Poster Session (NW4A)

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C. Egami, "Polarization-interferometric Nonlinear Confocal Microscopy for Measuring Single Nanoparticle," in Nonlinear Optics, B. Boulanger, S. Cundiff, M. Kauranen, and W. Knox, eds., OSA Technical Digest (online) (Optica Publishing Group, 2013), paper NW4A.37.

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Abstract

Polarization-interferometric nonlinear confocal microscopy is proposed for measuring a single DDS nanoparticle. 3D inspection inside the particle was performed through the third-order nonlinear dielectric polarization photoinduced.

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