Abstract
We present a third (and higher) order local dispersion characterization method for quality control of dispersion compensating gratings in 40Gbps RZ-DQPSK systems with small (<0.5dB) system penalty margin. Simulation results show that this approach is a simpler and more accurate indicator of system penalty due to group delay ripple, when compared to conventional methods based on phase ripple.
© 2009 Optical Society of America
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