Larger near-field probes with better resolution

M. Sumetsky

doi:10.1364/META_PLAS.2008.MThB7

Plasmonics and Metamaterials 2008

Rochester, New York United States
19–23 October 2008
ISBN: 978-1-55752-861-2

From the session
Nanoplasmonics III (MThB)

Larger near-field probes with better resolution

M. Sumetsky

Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing
OSA Technical Digest (CD) (Optical Society of America, 2008),
paper MThB7
•https://doi.org/10.1364/META_PLAS.2008.MThB7

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M. Sumetsky, "Larger near-field probes with better resolution," in Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing, OSA Technical Digest (CD) (Optical Society of America, 2008), paper MThB7.

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Related Topics
Optics & Photonics Topics
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The topics in this list come from the OSA Optics and Photonics Topics applied to this article.
Previously assigned OCIS codes
- Imaging systems (110.0110)
- Image formation theory (110.2990)
- Microscopy (180.0180)
- Near-field microscopy (180.4243)

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Abstract

Conventionally, super-resolution is achieved with extremely small near-field nanoprobes. However, larger probes enriched with high spatial frequencies generated by randomly distributed nanoparticles can provide better resolution even in the presence of substantial measurement noise.

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Abstract

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Plasmonics and Metamaterials 2008

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