Imaging with sub-wavelength resolution using a periodic metal-dielectric layered structure is demonstrated. The structure operates in canalization regime as a transmission device and it does not involve negative refraction and amplification of evanescent modes. The thickness of the structure has to be an integer number of half-wavelengths and can be as large as required for certain applications, in contrast to the metallic slabs operating with sub-wavelength resolution which have to be much thinner than the wavelength. Resolution of λ/20 at 600 nm wavelength is confirmed by numerical simulation for a 300 nm thick structure formed by a periodic stack of 10 nm layers of glass with ε=2 and 5 nm layers of metal-dielectric composite with ε=−1.

© 2006 Optical Society of America

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