Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Quantitative X-ray ultra-small angle scattering retrieval with structured illumination for microvessel characterization

Not Accessible

Your library or personal account may give you access

Abstract

A structured illumination based X-ray ultra-small angle scattering imaging resolves the orientation-dependent differential cross-section from a single shot, enabling texture analysis for microvessels with a large field of view.

© 2017 Optical Society of America

PDF Article
This paper was not presented at the conference

More Like This
Study of ultra-thin films in multilayer structures by standing -waves and small- angle x-ray scattering techniques

A.A. Fraerman, Yu. Ya. Platonov, N.I. Polushkin, N.N. Salashchenko, S.I. Zheludeva, M.V. Kovalchuk, N.N. Novikova, I.V. Bashelhanov, and A.V. Shubnikov
MC8 Physics of X-Ray Multilayer Structures (PXRAYMS) 1992

In-Situ Structural Characterization of Ultra-Thin Epitaxial Metal Films and Multilayers Observed with Grazing Incidence X-Ray Scattering

B. M. Clemens, J. A. Bain, B. M. Lairson, B. J. Daniels, A. P. Payne, N. M. Rensing, and S. Brennan
WC.1 Physics of X-Ray Multilayer Structures (PXRAYMS) 1994

Superresolution phase retrieval from non-sinusoidal structure illumination

Ziling Wu and Yunhui Zhu
JTu5A.21 3D Image Acquisition and Display: Technology, Perception and Applications (3D) 2017

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved