Abstract

This paper proposes a fractional Fourier method to analyze a single closed interferogram of the connector end-face. When shadowed or discontinuous areas exist, higher accuracy is obtained in comparison with 5-step phase shifting interferometry.

© 2017 Optical Society of America

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription