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Highly-sensitive detection of the lattice distortion in single bent ZnO nanowires by second-harmonic generation microscopy

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Abstract

A high detection sensitivity of ~0.001 nm on the bending distortion is obtained by measuring the SHG polarimetric patterns. The twisting distortion can also be detected by observing the extraordinary non-axisymmetrical SHG polarimetric patterns.

© 2016 Optical Society of America

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