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Characterization of metallic and dielectric thin films using surface plasmon resonance and the Abelès - Brewster technique

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Abstract

We presented the design and implementation of θ-2θ system which can be used in its surface plasmon resonance mode or can be adapted to Abeles-Brewster technique. Using this system it is possible to characterize metallic and dielectric thin films.

© 2015 Optical Society of America

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