PSF Analysis of Reflective Objectives based Nonlinear 4Pi Tomography

Chenglong Hao; Chenglong Hao; Changyuan Yu; Hao Li; Xia Yu; Ying Zhang

doi:10.1364/FIO.2015.JTu4A.62

Frontiers in Optics 2015
OSA Technical Digest (online) (Optica Publishing Group, 2015),
paper JTu4A.62
•https://doi.org/10.1364/FIO.2015.JTu4A.62

PSF Analysis of Reflective Objectives based Nonlinear 4Pi Tomography

Chenglong Hao, Changyuan Yu, Hao Li, Xia Yu, and Ying Zhang

Laser Science 2015

San Jose, California United States
18–22 October 2015
ISBN: 978-1-943580-03-3

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Poster Session - Tuesday (JTu4A)

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C. Hao, C. Yu, H. Li, X. Yu, and Y. Zhang, "PSF Analysis of Reflective Objectives based Nonlinear 4Pi Tomography," in Frontiers in Optics 2015, OSA Technical Digest (online) (Optica Publishing Group, 2015), paper JTu4A.62.

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Abstract

We proposed the nonlinear (second harmonic generation) 4Pi type C microscope using reflective objective in mid-infrared region. It provided a potential and practical solution of high resolution, deep penetration tomography in bio-medical application.

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