We investigated an imaging method by nanoscale localization sampling (NLS) to break an optical diffraction limit. NLS is a technique based on locally amplified hot spots occurred by surface plasmon localization on nanohole arrays. For experimental verification, we sampled rhodamine-labeled microtubules on nanohole arrays using total internal reflection fluorescence (TIRF) microscopy. The resolution enhancement is achieved at 76 nm resolution in the direction of a incident light and 135 nm orthogonally. Optimization of nanostructures is suggested for further reduction of resolution as well.
© 2011 Optical Society of AmericaPDF Article