Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Fabrication and Characterization of a Novel Nano-Probe Slide for Nano Optics

Not Accessible

Your library or personal account may give you access

Abstract

We present a novel nano-probe structure consisting of a sub-wavelength aperture of silicon and a slide of 30nm nitride film. Probe to probe scanning with a near-field scanning optical microscope shows sub-wavelength confinement of light.

© 2005 Optical Society of America

PDF Article
More Like This
Fabrication and Optical Characterization of GaAs Nano-whiskers

T. Katsuyama, K. Hiruma, T. Sato, K. Ogawa, M. Shirai, K. Haraguchi, and M. Yazawa
QThD3 Quantum Optoelectronics (QOE) 1995

Single Molecule Imaging Using a Highly Confined Optical Field at a Triangular Aperture

D. Molenda, U. C. Fischer, G. Colas des Francs, and A. Naber
QTuK1 Quantum Electronics and Laser Science Conference (CLEO:FS) 2005

Characterization of an Optical Waveguide by Disturbing Its Evanescent Field with a Fiber Probe

Dae Seo Park, Beom-Hoan O, Se-Geun Park, El-Hang Lee, Seung Gol Lee, and Won-soo Ji
JTuC29 Frontiers in Optics (FiO) 2005

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.