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Conferences > LAOP > 2018 > W3E > W3E.1

From Parameter Extraction, Variability Models to Yield Prediction

Yufei Xing, Jiaxing Dong, Umar Khan, Yinghao Ye, Domenico Spina, Tom Dhaene, and Wim Bogaerts

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Abstract

We will discuss methods and workflow of variability analysis and yield prediction for integrated photonic circuits, describing the process from wafer-scale parameter extraction over spatial variability modelling to layout-aware yield prediction of photonic circuits.

© 2018 The Author(s)

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