Abstract

We determine the dielectric function spectrum of a material in the 0-1 range, by analyzing the reflectance spectrum as a function of incidence angle. Results obtained for silicon carbide closely match data from the literature.

© 2018 The Author(s)

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription