Abstract

In this research we implemented a two-step phase shifting system based on two cyclic-path coupled interferometers for slope measurements of transparent samples. The optical system generates two π-shifted interferograms, and the phase shift between interferograms is obtained by rotating a linear polarizer. We analyzed the cases of four patterns with shifts of π/2 captured in two shots; the optical phase was processed by a four-step algorithm. In order to present the capabilities of the system, results obtained for slope for transparent microscopic samples are presented.

© 2016 Optical Society of America

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