Electron Holographic Interferometry: Taking Advantage of the Wave Nature of Electrons

Fernando Mendoza-Santoyo; Jesus Cantu-Valle; John E. Sanchez; Miguel José Yacamán; Arturo Ponce-Pedraza

doi:10.1364/LAOP.2014.LTh2B.1

Latin America Optics and Photonics Conference
OSA Technical Digest (online) (Optica Publishing Group, 2014),
paper LTh2B.1
•https://doi.org/10.1364/LAOP.2014.LTh2B.1

Electron Holographic Interferometry: Taking Advantage of the Wave Nature of Electrons

Fernando Mendoza-Santoyo, Jesus Cantu-Valle, John E. Sanchez, Miguel José Yacamán, and Arturo Ponce-Pedraza

Latin America Optics and Photonics Conference 2014

Cancun Mexico
16–21 November 2014
ISBN: 978-1-55752-825-4

From the session
Instrumentation, Optical Design, Color and Vision 2 (LTh2B)

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F. Mendoza-Santoyo, J. Cantu-Valle, J. E. Sanchez, M. J. Yacamán, and A. Ponce-Pedraza, "Electron Holographic Interferometry: Taking Advantage of the Wave Nature of Electrons," in Latin America Optics and Photonics Conference, OSA Technical Digest (online) (Optica Publishing Group, 2014), paper LTh2B.1.

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Abstract

Electron Holographic Interferometry (EHI) is a measurement tool in electron microscopes that is widely used to characterize the physical and mechanical properties of nanomaterials and structures thereof. We present state of the art EHI applications on novel nanoparticles. Article not available.

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