Widely-Tunable Rapid-Scanning Mid-IR Laser Spectrometer for Industrial Gas Process Stream Analysis

Douglas J. Bamford; David J. Cook; Scott J. Sharpe; Aaron D. Van Pelt

doi:10.1364/LACSEA.2006.PDP_11

Laser Applilcations to Chemical, Security and Environmental Analysis
Technical Digest (Optica Publishing Group, 2006),
paper PDP_11
•https://doi.org/10.1364/LACSEA.2006.PDP_11

Widely-Tunable Rapid-Scanning Mid-IR Laser Spectrometer for Industrial Gas Process Stream Analysis

Douglas J. Bamford, David J. Cook, Scott J. Sharpe, and Aaron D. Van Pelt

Laser Applications to Chemical, Security and Environmental Analysis 2006

Incline Village, Nevada United States
5–9 February 2006
ISBN: 1-55752-799-7

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Postdeadline Papers (PDP)

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D. J. Bamford, D. J. Cook, S. J. Sharpe, and A. D. Van Pelt, "Widely-Tunable Rapid-Scanning Mid-IR Laser Spectrometer for Industrial Gas Process Stream Analysis," in Laser Applilcations to Chemical, Security and Environmental Analysis, Technical Digest (Optica Publishing Group, 2006), paper PDP_11.

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