Abstract

Structured illumination microscopy (SIM) is a wide spread superresolution (SR) fluorescence microscopy technique with a two fold higher lateral resolution than conventional wide field fluorescence (WF) microscopy. SIM is considered to be the most compatible with biological applications because of its higher acquisition speed and wider selection of fluorescence probes than other superresolution microscopy techniques [1]. The super resolution of SIM is attributed to the two fold higher optical cut off frequency than that of WF. By contrast, confocal fluorescence (CF) microscopy has approximately the same optical cut off frequency as SIM, but the maximum theoretical increase in resolution over that of WF is 1.4 fold with an infinitesimal pinhole diameter.

© 2016 Japan Society of Applied Physics, Optical Society of America