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Phase Error Measurement of Arrayed-waveguide Grating

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Abstract

An arrayed-waveguide grating (AWG) is a planar lightwave circuit for wavelength division multiplexing, and demultiplexing in a photonic network. We proposed and fabricated a fast wavelength selective AWG using PLZT ((Pb, La)(Zr, Ti)O3) [1, 2]. However, phase errors of an arrayed-waveguide due to optical path length fluctuations cause deteriorations of characteristics, and especially cause large crosstalk between channels in the AWG [3]. We measured phase errors of PLZT-AWG based on the interference measurement technique [4, 5] to compensate them.

© 2013 Japan Society of Applied Physics, Optical Society of America

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