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Photoluminescence and photoreflectance spectroscopy in infrared of up to Terahertz

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Abstract

We outline recent infrared photoluminescence (PL) and photoreflectance (PR) activities in the SKLIP, with an introduction to the PL and PR techniques based on a step-scan Fourier transform infrared spectrometer. The results indicate the techniques be reliable and sensitive for semiconductors in infrared of even up to Terahertz.

© 2018 The Author(s)

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