Real-time optical imaging of physical fields in semiconductor materials

Alexander Grigorev; Alexander Grigorev; Elena Cherkesova; Anastasia Deulina; Olga Velichko; Olga Velichko

doi:10.1364/ISA.2019.IW1C.6

Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)
OSA Technical Digest (Optica Publishing Group, 2019),
paper IW1C.6
•https://doi.org/10.1364/ISA.2019.IW1C.6

Real-time optical imaging of physical fields in semiconductor materials

Alexander Grigorev, Elena Cherkesova, Anastasia Deulina, and Olga Velichko

Imaging Systems and Applications 2019

Munich Germany
24–27 June 2019
ISBN: 978-1-943580-63-7

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Industrial Imaging (IW1C)

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A. Grigorev, E. Cherkesova, A. Deulina, and O. Velichko, "Real-time optical imaging of physical fields in semiconductor materials," in Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP), OSA Technical Digest (Optica Publishing Group, 2019), paper IW1C.6.

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Abstract

A method for real-time optical imaging of physical fields in semiconductor materials based on using light from the fundamental absorption edge is proposed. This method can be used to measure physical properties of the material.

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