Abstract

We present two new directions in super resolved microscopy. The first uses a modified nonlinear image decomposition technique termed K-factor. It reshapes the 3D point spread function of an XYZ Z-stack images into a Gaussian shape, which simplifies the localization process and its accuracy, thus, the obtained resolution. The second improves the localization accuracy by labeling the specimens with gold nano particles and their subsequent flickering at different temporal frequencies.

© 2015 Optical Society of America

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