Abstract
We show that when a laser beam is tightly focused on a single boundary between two 180° anti-parallel ferroelectric domains, a strong enhancement of the Čerenkov second-harmonic generation in the direction perpendicular to the boundary occurs. Using this effect we develop a scanning Čerenkov second-harmonic microscopy which allows direct, three-dimensional and nondestructive imaging of the inverted domain pattern with sub-micrometer resolution.
© 2011 AOS
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