Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > IQEC > 2009 > JThE > JThE83
  • Conference on Lasers and Electro-Optics/International Quantum Electronics Conference
  • OSA Technical Digest (CD) (Optica Publishing Group, 2009),
  • paper JThE83
  • •https://doi.org/10.1364/CLEO.2009.JThE83

Modeling opto-electronic oscillators

Etgar C. Levy, Moshe Horowitz, Curtis R. Menyuk, Olukayode Okusaga, Weimin Zhou, and Gary M. Carter

Not Accessible

Your library or personal account may give you access

Abstract

A comprehensive model to accurately study phase noise and dynamics in optoelectronic oscillators is presented. The model results are compared to experiments. The comparison shows that the flicker noise increases as the cavity length increases.

© 2009 Optical Society of America

PDF Article
More Like This
Theoretical Investigation of Length-Dependent Flicker-Phase Noise in Opto-electronic Oscillators

Andrew Docherty, Olukayode Okusaga, Curtis R. Menyuk, Weimin Zhou, and Gary M. Carter
CFM1 CLEO: Science and Innovations (CLEO:S&I) 2011

Single-sideband hybrid opto-electronic oscillator

Aurélien Thorette, Marco Romanelli, Steve Bouhier, Frédéric van Dijk, M. Alouini, and Marc Vallet
cb_p_8 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 2019

Distance Measurement using Opto-Electronic Oscillators

Karim Elglmady, Osama Terra, Hatem Hussein, and Mohamed Medhat
ATu4I.5 CLEO: Applications and Technology (CLEO:A&T) 2022

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use